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Microwave electronics: Measurement and materials characterization
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| dc.contributor.author | L.F. Chen, C.P. Neo, V.K. Varadan C.K. Ong | |
| dc.date.accessioned | 2020-11-27T07:22:02Z | |
| dc.date.available | 2020-11-27T07:22:02Z | |
| dc.date.issued | 2004 | |
| dc.identifier.isbn | 978-047084492-2 | |
| dc.identifier.uri | http://10.250.8.41:8080/xmlui/handle/123456789/14403 | |
| dc.publisher | John Wiley & Sons, Inc. | en_US |
| dc.subject | Microwave Electronics | en_US |
| dc.title | Microwave electronics: Measurement and materials characterization | en_US |
| dc.type | Book | en_US |
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SEECS [168]