dc.contributor.author | Tian, Jeff | |
dc.date.accessioned | 2020-11-30T08:07:17Z | |
dc.date.available | 2020-11-30T08:07:17Z | |
dc.date.issued | 2005 | |
dc.identifier.isbn | 9780471713456 | |
dc.identifier.uri | http://10.250.8.41:8080/xmlui/handle/123456789/14692 | |
dc.publisher | Wiley-IEEE Computer Society Press | en_US |
dc.subject | Computer Science | en_US |
dc.title | Software Quality Engineering: Testing, Quality | en_US |
dc.type | Book | en_US |