dc.contributor.author | Suryanarayana, c. | |
dc.contributor.author | Norton, M. Grant | |
dc.date.accessioned | 2020-12-01T06:27:37Z | |
dc.date.available | 2020-12-01T06:27:37Z | |
dc.date.issued | 1998 | |
dc.identifier.isbn | 978-1-4899-0148-4 | |
dc.identifier.uri | http://10.250.8.41:8080/xmlui/handle/123456789/14880 | |
dc.language.iso | en_US | en_US |
dc.publisher | Springer Science+Business Media | en_US |
dc.subject | Characterization of Materials | en_US |
dc.subject | xrd | en_US |
dc.title | X-Ray Diffraction A Practical Approach | en_US |
dc.type | Book | en_US |