Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed.

dc.contributor.author	Goldstein, Joseph I.
dc.contributor.author	Newbury, Dale E.
dc.contributor.author	Michael, Joseph R.
dc.date.accessioned	2020-12-01T07:54:50Z
dc.date.available	2020-12-01T07:54:50Z
dc.date.issued	2018
dc.identifier.isbn	978-1-4939-6674-5
dc.identifier.uri	http://10.250.8.41:8080/xmlui/handle/123456789/14927
dc.language.iso	en_US	en_US
dc.publisher	Springer Science	en_US
dc.subject	SEM and EDS	en_US
dc.subject	Characterization of Materials	en_US
dc.subject	Scanning electron microscopy	en_US
dc.title	Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed.	en_US
dc.type	Book	en_US