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Comparative Analysis of Faults in Photovoltaic (PV) Systems and its Impact on Power Grid

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dc.contributor.author Gul, Saba
dc.date.accessioned 2023-08-09T06:37:24Z
dc.date.available 2023-08-09T06:37:24Z
dc.date.issued 2019
dc.identifier.other 00000203629
dc.identifier.uri http://10.250.8.41:8080/xmlui/handle/123456789/35914
dc.description Supervisor: Dr. Azhar Ul Haq en_US
dc.description.abstract Fault analysis in photovoltaic (PV) arrays is considered important for improving the safety and efficiency of a PV system. Faults do not only reduce efficiency but are also detrimental to the life span of a system. Output can be greatly affected by PV technology, configuration, and other operating conditions. Thus, it is important to consider the impact of different PV configurations and materials for thorough analysis of faults. This thesis presents a detailed investigation of faults including non-uniform shading, open circuit and short circuit in different PV interconnections including Series-Parallel (SP), Honey-Comb (HC) and Totalcross-Tied (TCT). A special case of multiple faults in PV array under non-uniform irradiance is also investigated to analyze their combined impact on considered different PV interconnections. In order to be more comprehensive, monocrystalline and thin-film PV are considered to analyze faults and their impact on power grids. Simulations are conducted in MATLAB/Simulink, and the obtained results in terms of power(P)–voltage(V) curve are compared and discussed. It is found that utilization of thin film PV technology with appropriated PV interconnections can minimize the impact of faults on a power grid with improved performance of the system. en_US
dc.language.iso en en_US
dc.publisher College of Electrical & Mechanical Engineering (CEME), NUST en_US
dc.subject Keywords: photovoltaic; PV arrays; PV fault analysis; PV interconnections; PV configurations; power grid; P-V curve en_US
dc.title Comparative Analysis of Faults in Photovoltaic (PV) Systems and its Impact on Power Grid en_US
dc.type Thesis en_US


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