dc.contributor.author | ZHU, YIMEI | |
dc.date.accessioned | 2024-09-16T07:00:33Z | |
dc.date.available | 2024-09-16T07:00:33Z | |
dc.date.issued | 2005 | |
dc.identifier.isbn | 1-4020-8007-7 | |
dc.identifier.uri | http://10.250.8.41:8080/xmlui/handle/123456789/46562 | |
dc.language.iso | en_US | en_US |
dc.publisher | KLUWER ACADEMIC PUBLISHERS | en_US |
dc.subject | Magnetic materials-Analysis. | en_US |
dc.subject | Magnetic materials -Microscopy | en_US |
dc.subject | Electrons - Scattering | en_US |
dc.title | MODERN TECHNIQUES FOR CHARACTERIZING MAGNETIC MATERIALS | en_US |
dc.type | Book | en_US |