Next Generation HALT and HASS : Robust Design of Electronics and Systems /

dc.contributor.author	Gray, Kirk A.
dc.contributor.author	Paschkewitz, John J.
dc.date.accessioned	2025-01-28T04:51:00Z
dc.date.available	2025-01-28T04:51:00Z
dc.date.issued	2016
dc.identifier.isbn	978-1118700235
dc.identifier.uri	http://10.250.8.41:8080/xmlui/handle/123456789/49250
dc.language.iso	en_US	en_US
dc.publisher	John Wiley & Sons, Ltd.	en_US
dc.relation.ispartofseries	(Wiley Series in Quality and Reliability Engineering);
dc.subject	Accelerated life testing	en_US
dc.subject	Electronic systems–Design and construction	en_US
dc.subject	Electronic systems–Testing	en_US
dc.title	Next Generation HALT and HASS : Robust Design of Electronics and Systems /	en_US
dc.type	Book	en_US