NUST Institutional Repository

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System /

Show simple item record

dc.contributor.author Du, Xiong
dc.contributor.author Zhang, Jun
dc.contributor.author Li, Gaoxian
dc.contributor.author Yu, Yaoyi
dc.contributor.author Qian, Cheng
dc.contributor.author Du, Rui
dc.date.accessioned 2025-02-07T05:21:10Z
dc.date.available 2025-02-07T05:21:10Z
dc.date.issued 2022
dc.identifier.isbn 978-981-19-3131-4 ; 978-981-19-3132-1(eBook)
dc.identifier.uri http://10.250.8.41:8080/xmlui/handle/123456789/49507
dc.language.iso en_US en_US
dc.publisher Springer Nature en_US
dc.relation.ispartofseries (CPSS Power Electronics Series);
dc.subject Thermal Reliability--Power Semiconductor Device en_US
dc.subject Renewable Energy System en_US
dc.title Thermal Reliability of Power Semiconductor Device in the Renewable Energy System / en_US
dc.type Book en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse

My Account