dc.contributor.author |
MUHAMMAD EHTISHAM SIDDIQI, Supervised By Dr Mushtaq Khan |
|
dc.date.accessioned |
2020-11-17T09:57:19Z |
|
dc.date.available |
2020-11-17T09:57:19Z |
|
dc.date.issued |
2018 |
|
dc.identifier.uri |
http://10.250.8.41:8080/xmlui/handle/123456789/12452 |
|
dc.description.abstract |
Cultural heritage is the legacy of physical relics and immaterial elements of a society that are gifted from past generations, sustained in the present era and imparted to the next generations for good. Tangible culture includes buildings, monuments, landscapes and artefacts etc.
Heritage reconfirms a nation’s or a society’s identity as human beings because it creates a comprehensive background for conservancy of the heritage.
Heritage preservation has been carried out via different processes and technologies, a number of scientists have worked on different methods for preservation of cultural heritage.
This research is about the possibility to use Handheld three dimensional laser scanning for the purpose of heritage preservation. Previously, research has been done for heritage preservation by means of photogrammetry, computer vision methods, remote sensing and spatial information science etc. and a great number of research papers are available depending upon their application to cultural heritage. This feasibility study will present how we can use handheld laser scanning and reverse engineering techniques to preserve and reproduce the cultural artefacts in forms of patterns or dies. This will help us and future generations to perceive and get valuable information about past generations. |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
SMME-NUST |
en_US |
dc.relation.ispartofseries |
SMME-TH-358; |
|
dc.subject |
Heritage preservation, Reverse Engineering, 3D Scanning, Computer Aided Manufacturing (CMM), Computer Aided Inspection (CAI), Creaform HandySCAN |
en_US |
dc.title |
FEASIBILITY STUDY OF USING LATEST 3D SCANNING AND REVERSE ENGINEERING TECHNIQUES FOR HERITAGE PRESERVATION |
en_US |
dc.type |
Thesis |
en_US |